An efficient method for analyzing on-chip thermal reliability considering process variations
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: ACM Transactions on Design Automation of Electronic Systems
سال: 2013
ISSN: 1084-4309,1557-7309
DOI: 10.1145/2491477.2491485